|
The errors I encountered were (reformatted to better fit):
Aug 30 00:10:20 ngaio kernel: ad0: FAILURE - READ_DMA status=51<READY,DSC,ERROR>
error=40<UNCORRECTABLE> LBA=82797535
Aug 30 00:10:20 ngaio kernel: GEOM_MIRROR: Request failed (error=5). ad0
[READ(offset=42392337920, length=2048)]
Aug 30 00:10:20 ngaio kernel: GEOM_MIRROR: Device gm0: provider ad0 disconnected.
The following command identified the HDD in question:
# atacontrol list
ATA channel 0:
Master: ad0 <SAMSUNG SP1203N/TL100-30> ATA/ATAPI revision 7
By 'identified', I mean I knew which HDD to look for. There was only one
Samsung in the machine.
Checking the gmirror status I saw:
# gmirror status
Name Status Components
mirror/gm0 DEGRADED ad3
In addition, I installed sysutils/smartmontools and got the following output:
# /usr/local/sbin/smartctl -a /dev/ad0
smartctl version 5.38 [i386-portbld-freebsd6.3] Copyright (C) 2002-8 Bruce Allen
Home page is http://smartmontools.sourceforge.net/
=== START OF INFORMATION SECTION ===
Model Family: SAMSUNG SpinPoint P80 series
Device Model: SAMSUNG SP1203N
Serial Number: S00QJ10Y282854
Firmware Version: TL100-30
User Capacity: 120,060,444,672 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 7
ATA Standard is: ATA/ATAPI-7 T13 1532D revision 0
Local Time is: Sat Aug 30 01:32:29 2008 BST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (4500) seconds.
Offline data collection
capabilities: (0x1b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
No Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
No General Purpose Logging support.
Short self-test routine
recommended polling time: ( 1) minutes.
Extended self-test routine
recommended polling time: ( 75) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 051 Pre-fail Always - 394
3 Spin_Up_Time 0x0007 100 100 025 Pre-fail Always - 5888
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 5
5 Reallocated_Sector_Ct 0x0033 100 100 011 Pre-fail Always - 0
7 Seek_Error_Rate 0x000f 100 100 051 Pre-fail Always - 0
8 Seek_Time_Performance 0x0025 100 100 015 Pre-fail Offline - 0
9 Power_On_Half_Minutes 0x0032 100 100 000 Old_age Always - 2656h+04m
10 Spin_Retry_Count 0x0033 100 100 051 Pre-fail Always - 0
11 Calibration_Retry_Count 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 5
194 Temperature_Celsius 0x0022 103 091 000 Old_age Always - 45
195 Hardware_ECC_Recovered 0x001a 100 100 000 Old_age Always - 298614779
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 1
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0
200 Multi_Zone_Error_Rate 0x000a 100 100 051 Old_age Always - 0
201 Soft_Read_Error_Rate 0x000a 100 100 051 Old_age Always - 6
SMART Error Log Version: 1
ATA Error Count: 1
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 1 occurred at disk power-on lifetime: 2654 hours (110 days + 14 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 04 df 63 ef e4 Error: UNC 4 sectors at LBA = 0x04ef63df = 82797535
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
c8 00 04 df 63 ef e4 00 13d+18:46:35.829 READ DMA
c8 00 04 07 49 eb e4 00 13d+18:46:35.829 READ DMA
c8 00 04 db 48 eb e4 00 13d+18:46:35.829 READ DMA
c8 00 04 03 3b eb e4 00 13d+18:46:35.829 READ DMA
c8 00 04 ab 3a eb e4 00 13d+18:46:35.829 READ DMA
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
Device does not support Selective Self Tests/Logging
|